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Articles
Superior reliability of high mobility (Si)Ge channel pMOSFETs
Publication:
Superior reliability of high mobility (Si)Ge channel pMOSFETs
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Date
2013
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Franco, Jacopo
;
Kaczer, Ben
;
Toledano Luque, Maria
;
Roussel, Philippe
;
Cho, Moon Ju
;
Kauerauf, Thomas
;
Mitard, Jerome
;
Eneman, Geert
;
Witters, Liesbeth
;
Grasser, Tibor
;
Groeseneken, Guido
Journal
Microelectronic Engineering
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Acq. date: 2025-12-16
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Views
1823
since deposited on 2021-10-21
1
last month
Acq. date: 2025-12-16
Citations