Publication:
SiGe channel technology: superior reliability toward ultra-thin EOT devices – Part II: time-dependent variability in nanoscaled devices and other reliability issues
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Acq. date: 2026-08-07
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Downloads
360 since deposited on 2021-10-21
43last month
12last week
Acq. date: 2026-08-07
Views
1818 since deposited on 2021-10-21
2last month
Acq. date: 2026-08-07
Citations