Publication:
SiGe channel technology: superior reliability toward ultra-thin EOT devices – Part II: time-dependent variability in nanoscaled devices and other reliability issues
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Acq. date: 2026-02-25
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1815 since deposited on 2021-10-21
Acq. date: 2026-02-25
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Downloads
199 since deposited on 2021-10-21
38last month
9last week
Acq. date: 2026-02-25
Views
1815 since deposited on 2021-10-21
Acq. date: 2026-02-25
Citations