Publication:
SiGe channel technology: superior reliability toward ultra-thin EOT devices – Part II: time-dependent variability in nanoscaled devices and other reliability issues
Date
Loading...
Journal
Abstract
Description
Metrics
Downloads
118 since deposited on 2021-10-21
45last month
9last week
Acq. date: 2025-12-16
Views
1815 since deposited on 2021-10-21
1last month
Acq. date: 2025-12-16
Citations
Metrics
Downloads
118 since deposited on 2021-10-21
45last month
9last week
Acq. date: 2025-12-16
Views
1815 since deposited on 2021-10-21
1last month
Acq. date: 2025-12-16
Citations