Authors

Groeseneken, Guido; Aoulaiche, Marc; Cho, Moon Ju; Franco, Jacopo; Kaczer, Ben; Kauerauf, Thomas; Mitard, Jerome; Ragnarsson, Lars-Ake; Roussel, Philippe; Toledano Luque, Maria

Conference

20th IEEE International Symposium on the Physicsal and Failure Analysis of Integrated Circuits - IPFA

Title

Bias-temperature instability of Si and Si(Ge)-channel sub-1nm EOT p-MOS devices: challenges and solutions

Publication type

Proceedings paper

Embargo date

9999-12-31