Publication:
Bias-temperature instability of Si and Si(Ge)-channel sub-1nm EOT p-MOS devices: challenges and solutions
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1954 since deposited on 2021-10-21
1last month
Acq. date: 2026-01-09
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Metrics
Views
1954 since deposited on 2021-10-21
1last month
Acq. date: 2026-01-09
Citations