Authors

Gupta, Somya; Simoen, Eddy; Vrielinck, Henk; Merckling, Clement; Vincent, Benjamin; Gencarelli, Federica; Loo, Roger; Heyns, Marc

Conference

Graphene, Ge/III-V, and Emerging Materials for Post CMOS Applications 5

Title

Identification of deep levels associated with extended and point defects in GeSn epitaxial layers using DLTS

Publication type

Proceedings paper

Embargo date

9999-12-31