Publication:
Identification of deep levels associated with extended and point defects in GeSn epitaxial layers using DLTS
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1965 since deposited on 2021-10-21
2last month
Acq. date: 2026-01-09
Citations
Metrics
Views
1965 since deposited on 2021-10-21
2last month
Acq. date: 2026-01-09
Citations