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Degradation of AlGaN/GaN Schottky diodes on silicon: Role of defects at the AlGaNGaN interface
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Degradation of AlGaN/GaN Schottky diodes on silicon: Role of defects at the AlGaNGaN interface
Date
2013
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Meneghini, Matteo
;
Bertin, Marco
;
Stocco, Antonio
;
dal Santo, Gabriele
;
Marcon, Denis
;
Malinowski, Pawel
;
Chini, Alessandro
;
Meneghesso, Gaudenzio
;
Zanoni, Enrico
Journal
Applied Physics Letters
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1939
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations
Metrics
Views
1939
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations