Authors

Raghavan, Naga; Degraeve, Robin; Goux, Ludovic; Fantini, Andrea; Wouters, Dirk; Groeseneken, Guido; Jurczak, Gosia

Conference

Symposium on VLSI Technology

Title

RTN insight to filamentary instability and disturb immunity in ultra-low power switching HfOx and AlOx-based RRAM

Publication type

Proceedings paper