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Residual stress in silicon caused by Cu-Sn wafer-level packaging
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Authors
Taklo, Maaike
;
Vardĝy, Astrid-Sofie
;
De Wolf, Ingrid
;
Simons, Veerle
;
van de Wiel, H.J.
;
van der Waal, Adri
;
Martinsen, Stian
;
Lapadatu, Adriana
;
Wunderle, Bernhard
Conference
International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems InterPACK
Title
Residual stress in silicon caused by Cu-Sn wafer-level packaging
Publication type
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