Authors

Toledano Luque, Maria; Kaczer, Ben; Aoulaiche, Marc; Spessot, Alessio; Roussel, Philippe; Ritzenthaler, Romain; Schram, Tom; Thean, Aaron; Groeseneken, Guido

ISSN

0167-9317

Journal

Microelectronic Engineering

Volume

109

Title

Analytical model for anomalous positive bias temperature instability in La-based HfO2 nFETs based on independent characterization of charging components

Publication type

Journal article