Publication:

Characterization of porous structures in advanced low-k films with thin TaN layers using monoenergetic positron beams

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1897 since deposited on 2021-10-21
1last month
1last week
Acq. date: 2026-08-11

Citations

Statistics

Views

1897 since deposited on 2021-10-21
1last month
1last week
Acq. date: 2026-08-11

Citations