Authors

Zanoni, Enrico; Meneghini, Matteo; Chini, Alessandro; Marcon, Denis; Meneghesso, Gaudenzio

ISSN

0018-9383

Issue

10

Journal

IEEE Transactions on Electron Devices

Volume

60

Title

AlGaNGaN-based HEMTs failure physics and reliability: mechanisms affecting gate edge and Schottky junction

Publication type

Journal article

Embargo date

9999-12-31