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In-depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature
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Authors
Achour, H.
;
Cretu, Bogdan
;
Routoure, Jean-Marc
;
Carin, Regis
;
Talmat, Rachida
;
Benfdila, A.
;
Simoen, Eddy
;
Claeys, Cor
ISSN
0038-1101
Journal
Solid-State Electronics
Volume
98
Title
In-depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature
Publication type
Journal article
Embargo date
9999-12-31
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