Circuit simulation of workload-dependent RTN and BTI based on trap kinetics

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Authors

Camargo, V. V. A.; Kaczer, Ben; Grasser, T.; Wirth, G.

ISSN

0026-2714

Issue

11

Journal

Microelectronics Reliability

Volume

54

Title

Circuit simulation of workload-dependent RTN and BTI based on trap kinetics

Publication type

Journal article

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