Authors

de Souza, M.A.S.; Doria, R.T.; Martino, Joao; Simoen, Eddy; Claeys, Cor; Pavanello, Marcelo

Conference

10th Workshop on the Thematic Network on Silicon on Insulator Technology, Devices and Circuits - EUROSOI

Title

Channel length influence on the low-frequency noise of strained 45o rotated triple gate SOI nFinFETs

Publication type

Proceedings paper