Authors

De Stefano, Francesca; Afanasiev, Valeri; Houssa, Michel; Goux, Ludovic; Opsomer, Karl; Jurczak, Gosia; Stesmans, Andre

ISSN

0167-9317

Journal

Microelectronic Engineering

Volume

120

Title

Influence of metal electrode stoichiometry on the electron barrier height at CuxTe1-x/Al2O3 interfaces for CBRAM

Publication type

Journal article