Authors

Fantini, Andrea; Goux, Ludovic; Redolfi, Augusto; Degraeve, Robin; Kar, Gouri Sankar; Chen, Yangyin; Jurczak, Gosia

Conference

Symposium on VLSI Technology

Title

Lateral and vertical scaling impact on statistical performances and reliability of 10nm TiN/Hf(Al)O/Hf/TiN RRAM devices

Publication type

Proceedings paper

Embargo date

9999-12-31