Authors

Huynh Bao, Trong; Yakimets, Dmitry; Ryckaert, Julien; Ciofi, Ivan; Baert, Rogier; Veloso, Anabela; Boemmels, Juergen; Collaert, Nadine; Roussel, Philippe; Demuynck, Steven; Raghavan, Praveen; Mercha, Abdelkarim; Tokei, Zsolt; Verkest, Diederik; Thean, Aaron; Wambacq, Piet

Conference

44th European Solid-State Device Research Conference - ESSDERC

Title

Circuit and process co-design with vertical gate-all-around nanowire FET technology to extend CMOS scaling for 5nm and beyond technologies

Publication type

Proceedings paper