Publication:
Back-channel-etch amorphous indium-gallium-zinc oxide thin-film transistors: The impact of source/drain metal etch and final passivation
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Downloads
1 since deposited on 2021-10-22
Acq. date: 2026-07-28
Views
2053 since deposited on 2021-10-22
Acq. date: 2026-07-28
Citations
Statistics
Downloads
1 since deposited on 2021-10-22
Acq. date: 2026-07-28
Views
2053 since deposited on 2021-10-22
Acq. date: 2026-07-28
Citations