Toggle navigation
My submissions
Login
Toggle navigation
View item
imec Publications Repository
imec Publications
Articles
View item
imec Publications Repository
imec Publications
Articles
View item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Back-channel-etch amorphous indium-gallium-zinc oxide thin-film transistors: The impact of source/drain metal etch and final passivation
View/
open
31078.pdf (1023.Kb)
Metadata
Show full item record
Authors
Nag, Manoj
;
Bhoolokam, Ajay
;
Steudel, Soeren
;
Myny, Kris
;
Maas, Joris
;
Vaisman Chasin, Adrian
;
Groeseneken, Guido
;
Heremans, Paul
ISSN
0021-4922
Issue
11
Journal
Japanese Journal of Applied Physics
Volume
53
Title
Back-channel-etch amorphous indium-gallium-zinc oxide thin-film transistors: The impact of source/drain metal etch and final passivation
Publication type
Journal article
Embargo date
9999-12-31
Collections
Articles
Search imec Publications Repository
This collection
Browse
All of imec Publications Repository
Collections
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
This collection
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
My account
login