Publication:
Ni(Pt) silicide with improved thermal stability for application in DRAM periphery and replacement metal gate devices
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Acq. date: 2025-12-11
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Acq. date: 2025-12-11
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2 since deposited on 2021-10-22
Acq. date: 2025-12-11
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1927 since deposited on 2021-10-22
6last month
1last week
Acq. date: 2025-12-11
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