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Ni(Pt) silicide with improved thermal stability for application in DRAM periphery and replacement metal gate devices

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2 since deposited on 2021-10-22
Acq. date: 2026-02-25

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1928 since deposited on 2021-10-22
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Acq. date: 2026-02-25

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2 since deposited on 2021-10-22
Acq. date: 2026-02-25

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1928 since deposited on 2021-10-22
1last month
Acq. date: 2026-02-25

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