Authors

Segers, Siegfried; Lauwaert, Johan; Clauws, Paul; Simoen, Eddy; Vanhellemont, Jan; Callens, Freddy; Vrielinck, Henk

ISSN

0268-1242

Issue

12

Journal

Semiconductor Science and Technology

Volume

29

Title

Direct estimation of captive cross sections in the presence of low capture: application of the identifcation of quenched-in deep-level defects in Ge

Publication type

Journal article