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Thermal stability and reliability in SiGe pMOSFETs for sub-20nm DRAM applications
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Authors
Son, Yunik
;
Noh, Kyung Bong
;
Aoulaiche, Marc
;
Ritzenthaler, Romain
;
Schram, Tom
;
Spessot, Alessio
;
Fazan, Pierre
;
Cho, Moon Ju
;
Franco, Jacopo
;
Horiguchi, Naoto
;
Thean, Aaron
Conference
IEEE 6th International Memory Workshop - IMW
Title
Thermal stability and reliability in SiGe pMOSFETs for sub-20nm DRAM applications
Publication type
Proceedings paper
Embargo date
9999-12-31
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