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HF-last wet clean in combination with a low temperature GeH4-assisted HCl in-situ clean prior to Si0.8Ge0.2-on-Si epitaxial growth
Publication:
HF-last wet clean in combination with a low temperature GeH4-assisted HCl in-situ clean prior to Si0.8Ge0.2-on-Si epitaxial growth
Date
2014
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wostyn, Kurt
;
Dhayalan, Sathish Kumar
;
Hikavyy, Andriy
;
Loo, Roger
;
Douhard, Bastien
;
Moussa, Alain
;
Rondas, Dirk
;
Kenis, Karine
;
Mertens, Paul
;
Holsteyns, Frank
;
De Gendt, Stefan
;
Profijt, Harald
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1901
since deposited on 2021-10-22
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Acq. date: 2025-10-24
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Metrics
Views
1901
since deposited on 2021-10-22
416
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations