Publication:

Stacked-etch induced charge loss in hybrid floating gate cells using high- $j inter-gate dielectric

Date

2014

Proceedings Paper

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Files

28235.pdf 458.77 KB

Author(s)

Zahid, Mohammed

;

Breuil, Laurent

;

Degraeve, Robin

;

;

;

;

Van den Bosch, Geert

;

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Acq. date: 2026-02-24