Authors

Zahid, Mohammed; Breuil, Laurent; Degraeve, Robin; Blomme, Pieter; Tan, Chi Lim; Lisoni, Judit; Van den Bosch, Geert; Van Houdt, Jan

Conference

International Reliability Physics Symposium - IRPS

Title

Stacked-etch induced charge loss in hybrid floating gate cells using high- $j inter-gate dielectric

Publication type

Proceedings paper

Embargo date

9999-12-31