Benchmarking of MoS2 FETs with multigate Si-FET options for 5 nm and beyond

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Authors

Agarwal Kumar, Tarun; Yakimets, Dmitry; Raghavan, Praveen; Radu, Iuliana; Thean, Aaron; Heyns, Marc; Dehaene, Wim

ISSN

0018-9383

Issue

12

Journal

IEEE Transactions on Electron Devices

Volume

62

Title

Benchmarking of MoS2 FETs with multigate Si-FET options for 5 nm and beyond

Publication type

Journal article

Embargo date

9999-12-31

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