Publication:
TCAD strain calibration versus nanobeam diffraction of source/drain stressors for Ge MOSFETs
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1869 since deposited on 2021-10-22
1last week
Acq. date: 2025-10-29
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Views
1869 since deposited on 2021-10-22
1last week
Acq. date: 2025-10-29
Citations