Authors

Coq Germanicus, Rosine; Leclère, Philippe; Guhel, Y.; Boudart, B.; Touboul, A. D.; Descamps, P.; Hug, E.; Eyben, Pierre

ISSN

0021-8979

Issue

24

Journal

Journal of Applied Physics

Volume

117

Title

On the effects of a pressure iInduced amorphous silicon layer on consecutive spreading resistance microscopy scans of doped silicon

Publication type

Journal article

Embargo date

9999-12-31