Publication:
Direct measurement of Leff and channel profile in MOSFETs using 2-D carrier profiling techniques
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1990 since deposited on 2021-09-30
8last month
Acq. date: 2026-02-26
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Statistics
Views
1990 since deposited on 2021-09-30
8last month
Acq. date: 2026-02-26
Citations