Authors

Duan, M.; Zhang, J. F.; Manut, A.; Ji, Z.; Zhang, W.; Asenov, A.; Gerrer, L.; Reid, D.; Razaidi, H.; Vigar, D.; Chandra, V.; Aitken, R.; Kaczer, Ben; Groeseneken, Guido

Conference

IEEE International Electron Devices Meeting - IEDM

Title

Hot carrier aging and its variation under use-bias: kinetics, prediction, impact on Vdd and SRAM

Publication type

Proceedings paper

Embargo date

9999-12-31