Authors

Oliveira, A.V.; Agopian, P.G.D.; Martino, J.A.; Fang, Wen; Arimura, Hiroaki; Mitard, Jerome; Mertens, Hans; Simoen, Eddy; Mocuta, Anda; Collaert, Nadine; Thean, Aaron; Claeys, Cor

Conference

Advanced CMOS-Compatible Semiconductor Devices 17

Title

Impact of gate stack dielectric on intrinsic voltage gain and low frequency noise in Ge pMOSFETs

Publication type

Proceedings paper

Embargo date

9999-12-31