Publication:

Impact of gate stack dielectric on intrinsic voltage gain and low frequency noise in Ge pMOSFETs

Date

2015

Proceedings Paper

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Files

31116.pdf 218.79 KB

Author(s)

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Agopian, P.G.D.

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Arimura, Hiroaki

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Collaert, Nadine

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Statistics

1900 since deposited on 2021-10-22

Acq. date: 2026-02-27