At-speed testing of inter-die connections of 3D-SICs in the presence of shore logic

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Authors
Shibin, Konstantin; Chickermane, Vivek; Keller, Brion; Papameletis, Christos; Marinissen, Erik Jan
Conference
IEEE Asian Test Symposium - ATS
Title
At-speed testing of inter-die connections of 3D-SICs in the presence of shore logic
Publication type
Proceedings paper
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