Authors

Trevisoli, R.; de Souza, M.; Martino, J.A.; Simoen, Eddy; Claeys, Cor; Pavanello, M.A.

ISSN

0167-9317

Journal

Microelectronic Engineering

Volume

147

Title

In-depth low frequency noise evaluation of substrate rotation and strain engineering in n-type triple gate SOI FinFETs

Publication type

Journal article