Authors

Jin, S.; Bender, Hugo; Li, X.; Dong, C.; Zhang, Zheng

Conference

Electron Microscopy 96; Proceedings of EUREM-11, the 11th Conference on Electron Microscopy

Title

Transmission electron microscopic study of new FeSi2 and TiSi2 phases prepared by ion implantation

Publication type

Proceedings paper

Embargo date

9999-12-31