Authors

Kaczer, Ben; Franco, Jacopo; Weckx, Pieter; Roussel, Philippe; Simicic, Marko; Putcha, Vamsi; Bury, Erik; Cho, Moon Ju; Degraeve, Robin; Linten, Dimitri; Groeseneken, Guido; Debacker, Peter; Parvais, Bertrand; Raghavan, Praveen; Catthoor, Francky; Rzepa, Gerhard; Waltl, Michael; Goes, Wolfgang; Grasser, Tibor

ISSN

0038-1101

Journal

Solid-State Electronics

Volume

125

Title

The defect-centric perspective of device and circuit reliability – From gate oxide defects to circuits

Publication type

Journal article