Authors

Ma, Jigang; Zhang, Wei Dong; Zhang, Jian Fu; Benbakhti, Brahim; Li, Zhigang; Mitard, Jerome; Arimura, Hiroaki

ISSN

0018-9383

Issue

10

Journal

IEEE Transactions on Electron Devices

Volume

63

Title

A comparative study of defect energy distribution and its impact on degradation kinetics in GeO2/Ge and SiON/Si pMOSFETs

Publication type

Journal article

Embargo date

9999-12-31