Publication:

Saturation Photo-Voltage methodology for semiconductor insulator interface trap spectroscopy

Date

2016

Journal article

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Files

32914.pdf 787.38 KB

Author(s)

;

Afanasiev, Valeri

;

;

Arimura, Hiroaki

;

Schulte-Braucks, C.

;

;

;

Von Den Driesch, N.

;

;

Ivanov, Tsvetan

;

Cuypers, Dieter

;

Stesmans, Andre

Journal

ECS Journal of Solid State Science and Technology

Statistics

1963 since deposited on 2021-10-23

2last month

Acq. date: 2026-08-18