Authors

Mohammed, Mazharuddin; Verhulst, Anne; Verreck, Devin; Degraeve, Robin; Kaczer, Ben; Simoen, Eddy; Soree, Bart; Van de Put, Maarten; Mocuta, Anda; Collaert, Nadine; Thean, Aaron; Groeseneken, Guido

ISSN

0021-8979

Issue

24

Journal

Journal of Applied Physics

Volume

120

Title

Electric-field induced quantum broadening of the characteristic energy level of traps in semiconductors and oxides

Publication type

Journal article

Embargo date

9999-12-31