Electrical effect of a single extended defect in MOSFETs: a simulation study

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Authors

Ni, Kai; Eneman, Geert; Simoen, Eddy; Mocuta, Anda; Collaert, Nadine; Thean, Aaron; Schrimpf, Ronald; Reed, Robert; Fleetwood, Daniel

ISSN

0018-9383

Issue

8

Journal

IEEE Transactions on Electron Devices

Volume

63

Title

Electrical effect of a single extended defect in MOSFETs: a simulation study

Publication type

Journal article

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