Publication:

Electrical effect of a single extended defect in MOSFETs: a simulation study

Date

2016

Journal article

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Author(s)

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Collaert, Nadine

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Schrimpf, Ronald

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Fleetwood, Daniel

Journal

IEEE Transactions on Electron Devices

Metrics

1922 since deposited on 2021-10-23

Acq. date: 2026-01-07