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Performance and manufacturability of the Co/Ti (cap) silicidation process for 0.25μm MOS technologies
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Authors
Lauwers, Anne
;
Besser, Paul
;
de Potter de ten Broeck, Muriel
;
Kondoh, Eiichi
;
Roelandts, Nico
;
Steegen, An
;
Stucchi, Michele
;
Maex, Karen
Conference
Proceedings of the IEEE 1998 International Interconnect Technology Conference - IITC
Title
Performance and manufacturability of the Co/Ti (cap) silicidation process for 0.25μm MOS technologies
Publication type
Proceedings paper
Embargo date
9999-12-31
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