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Low-frequency noise assessment of the oxide trap density in thick-oxide input-output transistors for DRAM applications
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Authors
Simoen, Eddy
;
Ritzenthaler, Romain
;
Cho, Moon Ju
;
Schram, Tom
;
Horiguchi, Naoto
;
Aoulaiche, Marc
;
Spessot, Alessio
;
Fazan, Pierre
;
Claeys, Cor
ISSN
2162-8769
Issue
6
Journal
ECS Journal of Solid State Science and Technology
Volume
5
Title
Low-frequency noise assessment of the oxide trap density in thick-oxide input-output transistors for DRAM applications
Publication type
Journal article
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