Publication:
An analytical model of MOS admittance for border trap density extraction in high-k dielectrics of III-V MOS devices
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1919 since deposited on 2021-10-23
1last month
Acq. date: 2026-01-11
Citations
Metrics
Views
1919 since deposited on 2021-10-23
1last month
Acq. date: 2026-01-11
Citations