Publication:
Gate-all-around nanowire FETs vs. triple-gate FinFETs: on gate integrity and device characteristics
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1938 since deposited on 2021-10-23
3last month
Acq. date: 2026-08-31
Citations
Statistics
Views
1938 since deposited on 2021-10-23
3last month
Acq. date: 2026-08-31
Citations