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Pattern collapse of high-aspect-ratio silicon nanostructures - A parametric study
Publication:
Pattern collapse of high-aspect-ratio silicon nanostructures - A parametric study
Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vrancken, Nandi
;
Vereecke, Guy
;
Bal, Stef
;
Sergeant, Stefanie
;
Doumen, Geert
;
Holsteyns, Frank
;
Terryn, Herman
;
De Gendt, Stefan
;
Xu, XiuMei
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1958
since deposited on 2021-10-23
Acq. date: 2025-10-24
Citations
Metrics
Views
1958
since deposited on 2021-10-23
Acq. date: 2025-10-24
Citations