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Positive bias temperature instability evaluation in fully recessed gate GaN MIS-FETs
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Authors
Wu, Tian-Li
;
Franco, Jacopo
;
Marcon, Denis
;
De Jaeger, Brice
;
Bakeroot, Benoit
;
Kang, Xuanwu
;
Stoffels, Steve
;
Van Hove, Marleen
;
Groeseneken, Guido
;
Decoutere, Stefaan
Conference
IEEE International Reliability Physics Symposium - IRPS
Title
Positive bias temperature instability evaluation in fully recessed gate GaN MIS-FETs
Publication type
Proceedings paper
Embargo date
9999-12-31
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