Authors

Bordallo, Caio; Martino, Joao; Agopian, Paula; Alian, AliReza; Mols, Yves; Rooyackers, Rita; Vandooren, Anne; Verhulst, Anne; Simoen, Eddy; Claeys, Cor; Collaert, Nadine

ISSN

0018-9383

Issue

9

Journal

IEEE Transactions on Electron Devices

Volume

64

Title

The influence of oxide thickness and indium amount on the analog parameters of gas phase Zn diffusion InxGa1-xAs nTFETs

Publication type

Journal article

Embargo date

9999-12-31