Publication:

SIMS analysis on the transistor scale: probing composition and dopants in non-planar, confined 3D-volumes

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1886 since deposited on 2021-10-24
3last month
2last week
Acq. date: 2026-01-07

Citations

Metrics

Views

1886 since deposited on 2021-10-24
3last month
2last week
Acq. date: 2026-01-07

Citations