Statistical assessment of the full VG/VD degradation space using dedicated device arrays

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Authors
Bury, Erik; Kaczer, Ben; Chuang, Kent; Franco, Jacopo; Weckx, Pieter; Vaisman Chasin, Adrian; Simicic, Marko; Linten, Dimitri; Groeseneken, Guido
Conference
IEEE International Reliability Physics Symposium - IRPS
Title
Statistical assessment of the full VG/VD degradation space using dedicated device arrays
Publication type
Proceedings paper
Embargo date
9999-12-31
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