Authors

Chai, Zheng; Ma, Jigang; Zhang, Weidong; Govoreanu, Bogdan; Ji, Zhigang; Zhang, Jian Fu; Jurczak, Gosia

ISSN

0018-9383

Issue

10

Journal

IEEE Transactions on Electron Devices

Volume

64

Title

Probing the critical region of conductive filament in nanoscale hafnium-oxide resistive-switching device by random telegraph signals

Publication type

Journal article

Embargo date

9999-12-31