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CMOS integration of thermally stable diffusion and gate replacement (D&GR) high-k/metal gate stacks in DRAM periphery transistors
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Authors
Dentoni Litta, Eugenio
;
Ritzenthaler, Romain
;
Schram, Tom
;
Spessot, Alessio
;
O'Sullivan, Barry
;
Ji, Yunhyuck
;
Mannaert, Geert
;
Lorant, Christophe
;
Sebaai, Farid
;
Thiam, Arame
;
Ercken, Monique
;
Demuynck, Steven
;
Horiguchi, Naoto
Conference
49th International Conferece on Solid State Devices and Materials - SSDM
Title
CMOS integration of thermally stable diffusion and gate replacement (D&GR) high-k/metal gate stacks in DRAM periphery transistors
Publication type
Proceedings paper
Embargo date
9999-12-31
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