Publication:

Self focusing SIMS: a new metrology for the analysis of confined volumes

Date

2017

Meeting abstract

Simple item page Full metadata Statistics

Files

36531.pdf 254.7 KB

Author(s)

Franquet, Alexis

;

Douhard, Bastien

;

Morris, Richard

;

Spampinato, Valentina

;

Conard, Thierry

;

Vandervorst, Wilfried

Metrics

1789 since deposited on 2021-10-24

Acq. date: 2026-01-11