Publication:

Study of recombination characteristics in MOCVD grown GaN epi-layers on Si

Date

2017

Journal article

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Author(s)

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Dobrovoliskas, D.

;

Malinauskas, T.

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Meskauskaite, D.

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Miosojedovas, S.

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Mickevicius, J.

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Journal

Semiconductor Science and Technology

Metrics

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Acq. date: 2026-01-11