Study of recombination characteristics in MOCVD grown GaN epi-layers on Si

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Authors

Gaubas, E.; Cepirus, T.; Dobrovoliskas, D.; Malinauskas, T.; Meskauskaite, D.; Miosojedovas, S.; Pavlov, J.; Rumbauskas, V.; Mickevicius, J.; Simoen, Eddy; Zhao, Ming

ISSN

0268-1242

Issue

12

Journal

Semiconductor Science and Technology

Volume

32

Title

Study of recombination characteristics in MOCVD grown GaN epi-layers on Si

Publication type

Journal article

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