Deep traps in In0.3Ga0.7As nFinFETs, studied by generation-recombination noise

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Authors
He, Liang; Chen, H.; Guo, D.D.; Hu, L.N.; Qin, Y.; Simoen, Eddy; Claeys, Cor; Kunert, Bernardette; Waldron, Niamh; Collaert, Nadine
Conference
International Conference on Noise and 1/f Fluctuations - ICNF
Title
Deep traps in In0.3Ga0.7As nFinFETs, studied by generation-recombination noise
Publication type
Proceedings paper
Embargo date
9999-12-31
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